Raw Mapping data

Published: 17 September 2025| Version 1 | DOI: 10.17632/jc2zrktwv6.1
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Description

Raw data acquired with a Bruker IRIS hyperspectral scanner. Spectral reflectance data between 400 and 2500 nm. X-ray fluorescence data.

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Institutions

University of Milano-Bicocca

Departments

Department of Materials Science

Categories

Spectroscopy, X-Ray Fluorescence Spectroscopy

Additional Metadata for University of Milano - Bicocca

Date the data was collected2025-05-08T22:00:00.000Z
ERC KeywordsPE4_17 Characterisation methods of materials, PE4_2 Spectroscopic and spectrometric techniques
SSD ClassificationFIS/07 - FISICA APPLICATA (A BENI CULTURALI, AMBIENTALI,
GeolocationItaly

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